A negative ion source test facility.
Melanson S, Dehnel M, Potkins D, Theroux J, Hollinger C, Martin J, Philpott C, Stewart T, Jackle P, Williams P, Brown S, Jones T, Coad B, Withington S.
Melanson S, et al. Among authors: potkins d.
Rev Sci Instrum. 2016 Feb;87(2):02B109. doi: 10.1063/1.4932320.
Rev Sci Instrum. 2016.
PMID: 26931991