An official website of the United States government
The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before
sharing sensitive information, make sure you’re on a federal
government site.
The site is secure.
The https:// ensures that you are connecting to the
official website and that any information you provide is encrypted
and transmitted securely.
Cao M, Wang F, Qiao ZW, Zhang HB, Nishi R.Cao M, et al.Micron. 2013 Jun;49:71-4. doi: 10.1016/j.micron.2013.02.011. Epub 2013 Mar 14.Micron. 2013.PMID: 23528481
Wang F, Zhang HB, Cao M, Nishi R, Takaoka A.Wang F, et al. Among authors: cao m.Ultramicroscopy. 2010 Feb;110(3):259-68. doi: 10.1016/j.ultramic.2009.12.013. Epub 2010 Jan 4.Ultramicroscopy. 2010.PMID: 20079570
Wang F, Zhang HB, Cao M, Nishi R, Takaoka A.Wang F, et al. Among authors: cao m.Micron. 2010 Jul;41(5):490-7. doi: 10.1016/j.micron.2010.01.010. Epub 2010 Feb 11.Micron. 2010.PMID: 20202855
Wang F, Zhang HB, Cao M, Nishi R, Takaoka A.Wang F, et al. Among authors: cao m.Micron. 2010 Oct;41(7):769-74. doi: 10.1016/j.micron.2010.05.014. Epub 2010 Jun 1.Micron. 2010.PMID: 20558075
Cao M, Zhang HB, Lu Y, Nishi R, Takaoka A.Cao M, et al.J Microsc. 2010 Jul 1;239(1):66-71. doi: 10.1111/j.1365-2818.2009.03357.x.J Microsc. 2010.PMID: 20579270Free PMC article.
Cao M, Takaoka A, Zhang HB, Nishi R.Cao M, et al.J Electron Microsc (Tokyo). 2011;60(1):39-46. doi: 10.1093/jmicro/dfq076. Epub 2010 Nov 12.J Electron Microsc (Tokyo). 2011.PMID: 21075783
Wang F, Cao M, Zhang HB, Nishi R, Takaoka A.Wang F, et al. Among authors: cao m.Rev Sci Instrum. 2011 Jun;82(6):066101. doi: 10.1063/1.3597672.Rev Sci Instrum. 2011.PMID: 21721736
Wang F, Zhang HB, Cao M, Nishi R, Takaoka A.Wang F, et al. Among authors: cao m.J Electron Microsc (Tokyo). 2011;60(5):315-20. doi: 10.1093/jmicro/dfr054. Epub 2011 Jul 19.J Electron Microsc (Tokyo). 2011.PMID: 21771806
Zhang HB, Li WQ, Cao M.Zhang HB, et al. Among authors: cao m.J Electron Microsc (Tokyo). 2012 Apr;61(2):85-97. doi: 10.1093/jmicro/dfr099. Epub 2012 Jan 2.J Electron Microsc (Tokyo). 2012.PMID: 22215798