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Characterization of Nanoporous Materials with Atom Probe Tomography.
Pfeiffer B, Erichsen T, Epler E, Volkert CA, Trompenaars P, Nowak C. Pfeiffer B, et al. Among authors: trompenaars p. Microsc Microanal. 2015 Jun;21(3):557-63. doi: 10.1017/S1431927615000501. Epub 2015 May 20. Microsc Microanal. 2015. PMID: 25990813
Fe:O:C grown by focused-electron-beam-induced deposition: magnetic and electric properties.
Lavrijsen R, Córdoba R, Schoenaker FJ, Ellis TH, Barcones B, Kohlhepp JT, Swagten HJ, Koopmans B, De Teresa JM, Magén C, Ibarra MR, Trompenaars P, Mulders JJ. Lavrijsen R, et al. Among authors: trompenaars p. Nanotechnology. 2011 Jan 14;22(2):025302. doi: 10.1088/0957-4484/22/2/025302. Epub 2010 Dec 7. Nanotechnology. 2011. PMID: 21135470
Spectral DQE of the Volta phase plate.
Buijsse B, Trompenaars P, Altin V, Danev R, Glaeser RM. Buijsse B, et al. Among authors: trompenaars p. Ultramicroscopy. 2020 Nov;218:113079. doi: 10.1016/j.ultramic.2020.113079. Epub 2020 Jul 22. Ultramicroscopy. 2020. PMID: 32739753 Free PMC article.
Sidewall angle tuning in focused electron beam-induced processing.
Hari S, van Dorp WF, Mulders JJL, Trompenaars PHF, Kruit P, Hagen CW. Hari S, et al. Among authors: trompenaars phf. Beilstein J Nanotechnol. 2024 Apr 23;15:447-456. doi: 10.3762/bjnano.15.40. eCollection 2024. Beilstein J Nanotechnol. 2024. PMID: 38711581 Free PMC article.