Kim Y - Search Results

1

Direct characterization of the energy level alignments and molecular components in an organic hetero-junction by integrated photoemission spectroscopy and reflection electron energy loss spectroscopy analysis.

Yun DJ, Shin WH, Bulliard X, Park JH, Kim S, Chung JG, Kim Y, Heo S, Kim SH. Yun DJ, et al. Among authors: kim sh, kim s, kim y. Nanotechnology. 2016 Aug 26;27(34):345704. doi: 10.1088/0957-4484/27/34/345704. Epub 2016 Jul 15. Nanotechnology. 2016. PMID: 27420635

2

Direct analytical method of contact position effects on the energy-level alignments at organic semiconductor/electrode interfaces using photoemission spectroscopy combined with Ar gas cluster ion beam sputtering.

Yun DJ, Chung J, Heon Kim S, Kim Y, Park S, Seol M, Heo S. Yun DJ, et al. Among authors: kim y. Nanotechnology. 2015 Nov 20;26(46):465704. doi: 10.1088/0957-4484/26/46/465704. Epub 2015 Oct 26. Nanotechnology. 2015. PMID: 26502302

3

Study on the disparate transition behaviors of the electrical/physical properties in PEDOT:PSS film depending on solvent species under a follow-up solution-treatment process.

Yun DJ, Kim JH, Kim SH, Seol M, Yu D, Kwon H, Ham Y, Chung J, Kim Y, Heo S. Yun DJ, et al. Among authors: kim sh, kim y, kim jh. Nanotechnology. 2016 Apr 22;27(16):165706. doi: 10.1088/0957-4484/27/16/165706. Epub 2016 Mar 10. Nanotechnology. 2016. PMID: 26963942

4

In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron Spectroscopy.

Yun DJ, Yun Y, Lee J, Kim JY, Chung J, Kim SH, Kim YS, Heo S, Park JI, Kim KH, Kwon YN, Chung JW. Yun DJ, et al. Among authors: kim jy, kim sh, kim ys, kim kh. ACS Appl Mater Interfaces. 2020 Nov 11;12(45):50628-50637. doi: 10.1021/acsami.0c09602. Epub 2020 Oct 27. ACS Appl Mater Interfaces. 2020. PMID: 32986402

5

Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering.

Yun DJ, Kim S, Jung C, Lee CS, Sohn H, Won JY, Kim YS, Chung J, Heo S, Kim SH, Seol M, Shin WH. Yun DJ, et al. Phys Chem Chem Phys. 2017 Dec 20;20(1):615-622. doi: 10.1039/c7cp06450k. Phys Chem Chem Phys. 2017. PMID: 29227482

6

Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering.

Yun DJ, Kim S, Jung C, Lee CS, Sohn H, Won JY, Kim YS, Chung J, Heo S, Kim SH, Seol M, Shin WH. Yun DJ, et al. Phys Chem Chem Phys. 2018 Jan 24;20(4):2914. doi: 10.1039/c7cp90282d. Phys Chem Chem Phys. 2018. PMID: 29303525

7

Bevel Structure Based XPS Analysis as a Non-Destructive Chemical Probe for Complex Interfacial Structures of Organic Semiconductors.

Yun DJ, Lee S, Kim SH, Jung C, Kim YS, Chung JG, Heo S, Kwon YN, Lee E, Kim JS, Ko DS, Kim SY. Yun DJ, et al. Small Methods. 2021 May;5(5):e2001264. doi: 10.1002/smtd.202001264. Epub 2021 Apr 10. Small Methods. 2021. PMID: 34928087

8

Nanoscale Electrical Degradation of Silicon-Carbon Composite Anode Materials for Lithium-Ion Batteries.

Kim SH, Kim YS, Baek WJ, Heo S, Yun DJ, Han S, Jung H. Kim SH, et al. ACS Appl Mater Interfaces. 2018 Jul 25;10(29):24549-24553. doi: 10.1021/acsami.8b07012. Epub 2018 Jul 11. ACS Appl Mater Interfaces. 2018. PMID: 29944824

9

Origins of High Performance and Degradation in the Mixed Perovskite Solar Cells.

Heo S, Seo G, Lee Y, Seol M, Kim SH, Yun DJ, Kim Y, Kim K, Lee J, Lee J, Jeon WS, Shin JK, Park J, Lee D, Nazeeruddin MK. Heo S, et al. Among authors: kim sh, kim y, kim k. Adv Mater. 2019 Feb;31(8):e1805438. doi: 10.1002/adma.201805438. Epub 2019 Jan 7. Adv Mater. 2019. PMID: 30614565

10

Protective Oxide Coating for Ionic Conductive Solid Electrolyte Interphase.

Kim YS, Kim SH, Kim G, Heo S, Mun J, Han S, Jung H, Kyoung YK, Yun DJ, Baek WJ, Doo S. Kim YS, et al. ACS Appl Mater Interfaces. 2016 Nov 16;8(45):30980-30984. doi: 10.1021/acsami.6b10934. Epub 2016 Nov 7. ACS Appl Mater Interfaces. 2016. PMID: 27787978

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