Wavefield characterization of nearly diffraction-limited focused hard x-ray beam with size less than 10 nm.
Kimura T, Mimura H, Handa S, Yumoto H, Yokoyama H, Imai S, Matsuyama S, Sano Y, Tamasaku K, Komura Y, Nishino Y, Yabashi M, Ishikawa T, Yamauchi K.
Kimura T, et al. Among authors: yokoyama h.
Rev Sci Instrum. 2010 Dec;81(12):123704. doi: 10.1063/1.3509384.
Rev Sci Instrum. 2010.
PMID: 21198029