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Effects of tilt on high-resolution ADF-STEM imaging.
Maccagnano-Zacher SE, Mkhoyan KA, Kirkland EJ, Silcox J. Maccagnano-Zacher SE, et al. Among authors: silcox j. Ultramicroscopy. 2008 Jul;108(8):718-26. doi: 10.1016/j.ultramic.2007.11.003. Epub 2007 Nov 13. Ultramicroscopy. 2008. PMID: 18160220
Effects of amorphous layers on ADF-STEM imaging.
Mkhoyan KA, Maccagnano-Zacher SE, Kirkland EJ, Silcox J. Mkhoyan KA, et al. Among authors: silcox j. Ultramicroscopy. 2008 Jul;108(8):791-803. doi: 10.1016/j.ultramic.2008.01.007. Epub 2008 Feb 14. Ultramicroscopy. 2008. PMID: 18374489
Artifacts in aberration-corrected ADF-STEM imaging.
Yu Z, Batson PE, Silcox J. Yu Z, et al. Among authors: silcox j. Ultramicroscopy. 2003 Sep;96(3-4):275-84. doi: 10.1016/S0304-3991(03)00093-7. Ultramicroscopy. 2003. PMID: 12871794
59 results