Winkelmann A - Search Results

1

Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction.

Hiller KP, Winkelmann A, Hourahine B, Starosta B, Alasmari A, Feng P, Wang T, Parbrook PJ, Zubialevich VZ, Hagedorn S, Walde S, Weyers M, Coulon PM, Shields PA, Bruckbauer J, Trager-Cowan C. Hiller KP, et al. Among authors: winkelmann a. Microsc Microanal. 2023 Dec 21;29(6):1879-1888. doi: 10.1093/micmic/ozad118. Microsc Microanal. 2023. PMID: 37947075

2

Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.

Naresh-Kumar G, Hourahine B, Edwards PR, Day AP, Winkelmann A, Wilkinson AJ, Parbrook PJ, England G, Trager-Cowan C. Naresh-Kumar G, et al. Among authors: winkelmann a. Phys Rev Lett. 2012 Mar 30;108(13):135503. doi: 10.1103/PhysRevLett.108.135503. Epub 2012 Mar 30. Phys Rev Lett. 2012. PMID: 22540714

3

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications.

Winkelmann A, Nolze G, Vespucci S, Naresh-Kumar G, Trager-Cowan C, Vilalta-Clemente A, Wilkinson AJ, Vos M. Winkelmann A, et al. J Microsc. 2017 Sep;267(3):330-346. doi: 10.1111/jmi.12571. Epub 2017 May 5. J Microsc. 2017. PMID: 28474742 Free article.

4

Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron Microscope.

Naresh-Kumar G, Bruckbauer J, Winkelmann A, Yu X, Hourahine B, Edwards PR, Wang T, Trager-Cowan C, Martin RW. Naresh-Kumar G, et al. Among authors: winkelmann a. Nano Lett. 2019 Jun 12;19(6):3863-3870. doi: 10.1021/acs.nanolett.9b01054. Epub 2019 May 13. Nano Lett. 2019. PMID: 31035764 Free article.

5

Kikuchi pattern simulations of backscattered and transmitted electrons.

Winkelmann A, Nolze G, Cios G, Tokarski T, Bała P, Hourahine B, Trager-Cowan C. Winkelmann A, et al. J Microsc. 2021 Nov;284(2):157-184. doi: 10.1111/jmi.13051. Epub 2021 Aug 9. J Microsc. 2021. PMID: 34275156 Free article.

6

Many-beam dynamical simulation of electron backscatter diffraction patterns.

Winkelmann A, Trager-Cowan C, Sweeney F, Day AP, Parbrook P. Winkelmann A, et al. Ultramicroscopy. 2007 Apr-May;107(4-5):414-21. doi: 10.1016/j.ultramic.2006.10.006. Epub 2006 Nov 13. Ultramicroscopy. 2007. PMID: 17126489

7

Improving EBSD precision by orientation refinement with full pattern matching.

Winkelmann A, Jablon BM, Tong VS, Trager-Cowan C, Mingard KP. Winkelmann A, et al. J Microsc. 2020 Feb;277(2):79-92. doi: 10.1111/jmi.12870. J Microsc. 2020. PMID: 31997348 Free article.

8

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction.

Naresh-Kumar G, Vilalta-Clemente A, Jussila H, Winkelmann A, Nolze G, Vespucci S, Nagarajan S, Wilkinson AJ, Trager-Cowan C. Naresh-Kumar G, et al. Among authors: winkelmann a. Sci Rep. 2017 Sep 7;7(1):10916. doi: 10.1038/s41598-017-11187-z. Sci Rep. 2017. PMID: 28883500 Free PMC article.

9

A Pattern Processing Method to Map Nanoscale Phases by EBSD.

Brodu E, Winkelmann A, Seefeldt M. Brodu E, et al. Among authors: winkelmann a. Microsc Microanal. 2022 Apr 8:1-7. doi: 10.1017/S1431927622000526. Online ahead of print. Microsc Microanal. 2022. PMID: 35392998

10

Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps.

Winkelmann A, Nolze G, Cios G, Tokarski T, Bała P. Winkelmann A, et al. Materials (Basel). 2020 Jun 23;13(12):2816. doi: 10.3390/ma13122816. Materials (Basel). 2020. PMID: 32585868 Free PMC article.

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