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Macarulla Rodriguez A, Geradts Z, Worring M, Unzueta L.Macarulla Rodriguez A, et al. Among authors: worring m.Forensic Sci Int Synerg. 2024 Feb 29;8:100458. doi: 10.1016/j.fsisyn.2024.100458. eCollection 2024.Forensic Sci Int Synerg. 2024.PMID: 38487302Free PMC article.
Najdenkoska I, Zhen X, Worring M, Shao L.Najdenkoska I, et al. Among authors: worring m.Med Image Anal. 2022 Nov;82:102603. doi: 10.1016/j.media.2022.102603. Epub 2022 Aug 30.Med Image Anal. 2022.PMID: 36116297Free article.
Zahalka J, Worring M, Van Wijk JJ.Zahalka J, et al. Among authors: worring m.IEEE Trans Vis Comput Graph. 2021 Feb;27(2):422-431. doi: 10.1109/TVCG.2020.3030383. Epub 2021 Jan 28.IEEE Trans Vis Comput Graph. 2021.PMID: 33074815
Fischer MT, Arya D, Streeb D, Seebacher D, Keim DA, Worring M.Fischer MT, et al. Among authors: worring m.IEEE Trans Vis Comput Graph. 2021 Feb;27(2):550-560. doi: 10.1109/TVCG.2020.3030408. Epub 2021 Jan 28.IEEE Trans Vis Comput Graph. 2021.PMID: 33048721
de Rooij O, van Wijk JJ, Worring M.de Rooij O, et al. Among authors: worring m.IEEE Comput Graph Appl. 2010 Sep-Oct;30(5):42-51. doi: 10.1109/MCG.2010.66.IEEE Comput Graph Appl. 2010.PMID: 24807413No abstract available.
Nguyen HT, Worring M, Dev A.Nguyen HT, et al. Among authors: worring m.IEEE Trans Image Process. 2000;9(1):137-41. doi: 10.1109/83.817605.IEEE Trans Image Process. 2000.PMID: 18255379
Nguyen HT, Worring M, van den Boomgaard R, Smeulders AW.Nguyen HT, et al. Among authors: worring m.IEEE Trans Image Process. 2002;11(9):1081-91. doi: 10.1109/TIP.2002.802522.IEEE Trans Image Process. 2002.PMID: 18249729