Adaptive aberration correction in a two-photon microscope

J Microsc. 2000 Nov;200 (Pt 2):105-8. doi: 10.1046/j.1365-2818.2000.00770.x.

Abstract

We demonstrate aberration correction in two-photon microscopy. Specimen-induced aberrations were measured with a modal wavefront sensor, implemented using a ferro-electric liquid crystal spatial light modulator (FLCSLM). Wavefront correction was performed using the same FLCSLM. Axial scanned (xz) images of fluorescently labelled polystyrene beads using an oil immersion lens show restored sectioning ability at a depth of 28 &mgr;m in an aqueous specimen.