Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

T Warwick; H Ade; S Cerasari; J Denlinger; K Franck; A Garcia; S Hayakawa; A Hitchcock; J Kikuma; S Klingler; J Kortright; G Morisson; M Moronne; E Rightor; E Rotenberg; S Seal; H J Shin; W F Steele; B P Tonner

doi:10.1107/S0909049597014283

Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

J Synchrotron Radiat. 1998 May 1;5(Pt 3):1090-2. doi: 10.1107/S0909049597014283. Epub 1998 May 1.

Authors

Affiliation

¹ Lawrence Berkeley National Laboratory, University of California, Berkeley, California, USA.

PMID: 15263755
DOI: 10.1107/S0909049597014283

Abstract

The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.