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, 96 (1), 010401

Quantum Metrology


Quantum Metrology

Vittorio Giovannetti et al. Phys Rev Lett.


We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.

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