Bond fluctuation of S/Se anchoring observed in single-molecule conductance measurements using the point contact method with scanning tunneling microscopy

Satoshi Yasuda; Shoji Yoshida; Jiro Sasaki; Yoshitaka Okutsu; Tohru Nakamura; Atsushi Taninaka; Osamu Takeuchi; Hidemi Shigekawa

doi:10.1021/ja062066l

Bond fluctuation of S/Se anchoring observed in single-molecule conductance measurements using the point contact method with scanning tunneling microscopy

J Am Chem Soc. 2006 Jun 21;128(24):7746-7. doi: 10.1021/ja062066l.

Authors

Satoshi Yasuda¹, Shoji Yoshida, Jiro Sasaki, Yoshitaka Okutsu, Tohru Nakamura, Atsushi Taninaka, Osamu Takeuchi, Hidemi Shigekawa

Affiliation

¹ Institute of Applied Physics, CREST-JST, 21st Century COE, University of Tsukuba, Tsukuba 305-8573, Japan.

PMID: 16771482
DOI: 10.1021/ja062066l

Abstract

Conductance was measured for the single molecules with S/Se anchoring on a Au surface using the point contact method with scanning tunneling microscopy that enables us to selectively perform a repeated analysis of a chosen target molecule. Apparent conductance changes observed in sequential measurements suggest the existence of bond fluctuation among the adsorption sites.