X-ray diffraction structure analysis of MCM-48 mesoporous silica

Leonid A Solovyov; Oleg V Belousov; Robert E Dinnebier; Alexander N Shmakov; Sergey D Kirik

doi:10.1021/jp0482868

X-ray diffraction structure analysis of MCM-48 mesoporous silica

J Phys Chem B. 2005 Mar 3;109(8):3233-7. doi: 10.1021/jp0482868.

Authors

Leonid A Solovyov¹, Oleg V Belousov, Robert E Dinnebier, Alexander N Shmakov, Sergey D Kirik

Affiliation

¹ Institute of Chemistry and Chemical Technology, 660049 Krasnoyarsk, Russia. leosol@icct.ru

PMID: 16851346
DOI: 10.1021/jp0482868

Abstract

The structure of MCM-48 mesoporous silicate materials has been fully characterized from X-ray diffraction data by applying recently developed methods of mesostructure analysis and full-profile refinement. The pore wall thickness of both as-made and calcined MCM-48 was determined with high precision to be 8.0(1) Angstrom. No regular variations of the wall thickness were detected, but its density was found to be ca. 10% higher in the low-curvature regions. The surfactant density in the pores was assessed around 0.6-0.7 g/cm(3) and was found to have a distinct minimum in the pore center similar to that detected previously in MCM-41. A new extended model function of the density distribution in MCM-48 is proposed on the basis of the structural features that were revealed.