Based on the change patterns of leaf area index (LAI) and canopy spectral reflectance of wheat at different growth stages and nitrogen application rates, this paper investigated the relationships of LAI with canopy reflectance and spectral parameters, and brought forward the sensitive spectral parameters and quantitative equation for predicting wheat LAI. The results showed that with increasing nitrogen application rate, wheat LAI and its canopy reflectance at near infrared (760 to approximately 1220 nm) increased, whereas the reflectance at visible band (460 to approximately 710 nm) decreased. From jointing to maturity, the LAI and the reflectance of short bands in near infrared increased initially and decreased then, whereas the reflectance of visible light and long bands in near infrared was in adverse, with the lowest value appeared at booting stage. Wheat LAI was negatively correlated with the reflectance of visible light, but positively with that of short bands in near infrared, with the highest correlation coefficient at 810 nm. It was proposed that wheat LAI could be well monitored by vegetation indices RVI (810, 510) and DVI (810, 560). PVI and TSAVI were proved to be the spectral indices in monitoring wheat LAI, and higher accuracy was obtained with combined RVI (810, 510), DVI (810, 560) and PVI.