WSXM: a software for scanning probe microscopy and a tool for nanotechnology

Rev Sci Instrum. 2007 Jan;78(1):013705. doi: 10.1063/1.2432410.

Abstract

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.

MeSH terms

  • Image Enhancement*
  • Microscopy, Atomic Force* / methods
  • Nanotechnology* / methods
  • Software*