Invited review article: a review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements

Yang Gan

doi:10.1063/1.2754076

Invited review article: a review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements

Rev Sci Instrum. 2007 Aug;78(8):081101. doi: 10.1063/1.2754076.

Author

Yang Gan¹

Affiliation

¹ Chemical Engineering, School of Engineering, University of Newcastle, Callaghan, NSW, Australia. yang_gan@yahoo.com

PMID: 17764306
DOI: 10.1063/1.2754076

Abstract

Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.

Publication types

Review

MeSH terms

Adsorption
Materials Testing / instrumentation*
Materials Testing / methods*
Microscopy, Scanning Probe / instrumentation*
Microscopy, Scanning Probe / methods*
Microspheres
Molecular Probe Techniques / instrumentation*
Nanoparticles / chemistry*
Nanoparticles / ultrastructure
Optics and Photonics / instrumentation
Stress, Mechanical
Surface Properties