We show that while the statistics of static speckle patterns are generic, fluctuations in the change within speckle patterns are greatly enhanced in the localization transition. The probability distributions of the displacement of phase singularities and the standard deviations of the changes of phase and intensity with frequency shift of incident microwave radiation are given in terms of the same expression which describes the probability distribution of total transmission. This function depends only upon a single parameter, the variance of the corresponding variable. The changing statistics in the localization transition reflects the number of underlying electromagnetic modes with which the incident wave interacts.