Subdiffraction far-field imaging of luminescent single-walled carbon nanotubes

Nano Lett. 2008 Feb;8(2):749-53. doi: 10.1021/nl0725300. Epub 2008 Jan 31.


Far-field near-infrared fluorescence microscopy of single-walled carbon nanotubes (SWNTs) has been hampered by the diffraction limit to resolution. A new analysis method is presented that allows subwavelength (<lambda/10) mapping of single-molecule chemical reaction sites on semiconducting SWNTs, enabling precise localization of excitonic luminescence regions along the nanotube axis through a nonperturbing, far-field optical measurement. This method is applied to reveal the subdiffraction lengths, curvatures, and defects of luminescent SWNTs in unprecedented detail.

Publication types

  • Research Support, Non-U.S. Gov't
  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Luminescent Measurements / methods*
  • Materials Testing / methods*
  • Nanostructures / chemistry*
  • Nanostructures / ultrastructure*
  • Nanotechnology / methods*
  • Particle Size
  • Refractometry / methods*