Robust single-nanoparticle probe for contact-mode analysis and dip-pen nanolithography

Small. 2008 Aug;4(8):1072-5. doi: 10.1002/smll.200701102.
No abstract available

Publication types

  • Comparative Study
  • Research Support, Non-U.S. Gov't

MeSH terms

  • Elasticity
  • Gold
  • Metal Nanoparticles* / ultrastructure
  • Microscopy, Atomic Force / instrumentation*
  • Microscopy, Atomic Force / methods*
  • Microscopy, Electron, Scanning / instrumentation*
  • Microscopy, Electron, Scanning / methods
  • Molecular Probes / ultrastructure
  • Nanotechnology* / instrumentation
  • Silicon Dioxide
  • Surface Properties

Substances

  • Molecular Probes
  • Gold
  • Silicon Dioxide