Sensitive photothermal deflection technique for measuring absorption in optically thin media
Opt Lett
.
1980 Sep 1;5(9):377.
doi: 10.1364/ol.5.000377.
Authors
A C Boccara
,
D Fournier
,
W Jackson
,
N M Amer
PMID:
19693234
DOI:
10.1364/ol.5.000377
No abstract available