Gertrude Rempfer and the development of high resolution focused ion beam technology

Jon Orloff

doi:10.1016/j.ultramic.2011.10.002

Gertrude Rempfer and the development of high resolution focused ion beam technology

Ultramicroscopy. 2012 Aug:119:5-8. doi: 10.1016/j.ultramic.2011.10.002. Epub 2011 Oct 13.

Author

Jon Orloff¹

Affiliation

¹ Department of Electrical and Computer Engineering, University of Maryland at College Park, P.O. Box 70, Rockaway Beach, OR 97136, USA. jon.orloff@mindspring.com

PMID: 22079381
DOI: 10.1016/j.ultramic.2011.10.002

Abstract

High resolution focused ion beam (FIB) technology depends on electrostatic optics. As a longtime researcher on electrostatic optics Dr. Gertrude Rempfer has had a great impact not only on the development of FIB technology but, as a result, also on several technology areas dependent on it. This paper provides a brief description of how that came about.