Bulk optical absorption of high resistivity silicon at 1550 nm

Opt Lett. 2013 Jun 15;38(12):2047-9. doi: 10.1364/OL.38.002047.

Abstract

We report on the measurement of the optical absorption of bulk crystalline silicon at 1550 nm. Using the photodeflection technique, absorption as low as 5 ppm/cm has been measured on a sample with a resistivity of 10 kΩ·cm. The absorption as a function of the resistivity has been derived for n-type silicon.