A non-invasive method for measuring the refractive index, extinction coefficient and film thickness of absorptive thin films using spectral-domain optical coherent tomography is proposed, analyzed and experimentally demonstrated. Such an optical system employing a normal-incident beam of light exhibits a high spatial resolution. There are no mechanical moving parts involved for the measurement except the transversal scanning module for the measurement at various transversal locations. The method was experimentally demonstrated on two absorptive thin-film samples coated on transparent glass substrates. The refractive index and extinction coefficient spectra from 510 to 580 nm wavelength range and film thickness were simultaneously measured. The results are presented and discussed.