Modelling the inelastic scattering of fast electrons

Ultramicroscopy. 2015 Apr;151:11-22. doi: 10.1016/j.ultramic.2014.10.011. Epub 2014 Oct 29.

Abstract

Imaging at atomic resolution based on the inelastic scattering of electrons has become firmly established in the last three decades. Harald Rose pioneered much of the early theoretical work on this topic, in particular emphasising the role of phase and the importance of a mixed dynamic form factor. In this paper we review how the modelling of inelastic scattering has subsequently developed and how numerical implementation has been achieved. A software package μSTEM is introduced, capable of simulating various imaging modes based on inelastic scattering in both scanning and conventional transmission electron microscopy.

Keywords: Atomic resolution imaging; Inelastic scattering of fast electrons; Mixed dynamic form factor.

Publication types

  • Research Support, Non-U.S. Gov't