Enhanced light output power of thin film GaN-based high voltage light-emitting diodes

Opt Express. 2014 Oct 20:22 Suppl 6:A1462-8. doi: 10.1364/OE.22.0A1462.

Abstract

The characteristics of high-voltage light-emitting diodes (HVLEDs) consisting of a 64-cell LED array were investigated by employing various LED structures. Two types of HVLED were examined: a standard HVLED with a single roughened indium tin oxide (ITO) surface grown on a sapphire substrate and a thin-film HVLED (TF-HVLED) with a roughened n-GaN and ITO double side transferred to a mirror/silicon substrate. At an injection current of 24 mA, the output powers of the HVLEDs fabricated using a sapphire substrate and those fabricated using a mirror/silicon substrate were 170 and 216 mW, respectively. Because the TF-HVLED exhibited improved thermal dissipation and light extraction, it produced a greater output power than the HVLED fabricated using the sapphire substrate did.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Aluminum Oxide / chemistry*
  • Aluminum Oxide / radiation effects
  • Energy Transfer
  • Equipment Design
  • Equipment Failure Analysis
  • Gallium / chemistry*
  • Lenses*
  • Light
  • Lighting / instrumentation*
  • Metal Nanoparticles / chemistry*
  • Scattering, Radiation
  • Semiconductors*

Substances

  • gallium nitride
  • Gallium
  • Aluminum Oxide