Safe for Generations to Come

IEEE Microw Mag. 2015 Mar;16(2):65-84. doi: 10.1109/MMM.2014.2377587. Epub 2015 Feb 5.

Authors

Ting Wu¹, Theodore S Rappaport², Christopher M Collins³

Affiliations

¹ New York University (NYU) WIRELESS, the NYU Polytechnic School of Engineering, Brooklyn, New York, United States. ( ting.wu@nyu.edu ).
² NYU WIRELESS, the NYU Polytechnic School of Engineering, Brooklyn, New York, United States, and the NYU Department of Radiology, New York, United States. ( tsr@nyu.edu ).
³ NYU WIRELESS, the NYU Department of Radiology, New York, United States. ( c.collins@nyumc.org ).

No abstract available

Grants and funding

P41 EB017183/EB/NIBIB NIH HHS/United States