Degradation Mechanisms of Solution-Processed Planar Perovskite Solar Cells: Thermally Stimulated Current Measurement for Analysis of Carrier Traps

Chuanjiang Qin; Toshinori Matsushima; Takashi Fujihara; William J Potscavage Jr; Chihaya Adachi

doi:10.1002/adma.201502610

Degradation Mechanisms of Solution-Processed Planar Perovskite Solar Cells: Thermally Stimulated Current Measurement for Analysis of Carrier Traps

Adv Mater. 2016 Jan 20;28(3):466-71. doi: 10.1002/adma.201502610. Epub 2015 Nov 24.

Authors

Chuanjiang Qin^{1

2}, Toshinori Matsushima^{1

2}, Takashi Fujihara³, William J Potscavage Jr^{1

2}, Chihaya Adachi^{1

2

4}

Affiliations

¹ Center for Organic Photonics and Electronics Research (OPERA), Kyushu University, 744 Motooka, Nishi, Fukuoka, 819-0395, Japan.
² Japan Science and Technology Agency (JST), ERATO, Adachi Molecular Exciton Engineering Project, 744 Motooka, Nishi, Fukuoka, 819-0395, Japan.
³ Innovative Organic Device Laboratory, Institute of Systems, Information Technologies and Nanotechnologies (ISIT), 744 Motooka, Nishi, Fukuoka, 819-0395, Japan.
⁴ International Institute for Carbon Neutral Energy Research (WPI-I2CNER), Kyushu University, 744 Motooka, Nishi, Fukuoka, 819-0395, Japan.

PMID: 26598398
DOI: 10.1002/adma.201502610

Abstract

Degradation mechanisms of CH3 NH3 PbI3 -based planar perovskite solar cells (PSCs) are investigated using a thermally stimulated current technique. Hole traps lying above the valence-band edge of the CH3 NH3 PbI3 are detected in PSCs degraded by continuous simulated solar illumination. One source of the hole traps is the photodegradation of CH3 NH3 PbI3 in the presence of water.

Keywords: carrier traps; degradation mechanisms; perovskite solar cells; solution-processed; thermally stimulated current.