A negative ion source test facility

S Melanson; M Dehnel; D Potkins; J Theroux; C Hollinger; J Martin; C Philpott; T Stewart; P Jackle; P Williams; S Brown; T Jones; B Coad; S Withington

doi:10.1063/1.4932320

A negative ion source test facility

Rev Sci Instrum. 2016 Feb;87(2):02B109. doi: 10.1063/1.4932320.

Authors

S Melanson¹, M Dehnel¹, D Potkins¹, J Theroux¹, C Hollinger¹, J Martin¹, C Philpott², T Stewart¹, P Jackle¹, P Williams², S Brown², T Jones², B Coad², S Withington¹

Affiliations

¹ D-Pace, Inc., P.O. Box 201, Nelson, British Columbia V1L 5P9, Canada.
² Buckley Systems Ltd., 6 Bowden Road, Mount Wellington, Auckland 1060, New Zealand.

PMID: 26931991
DOI: 10.1063/1.4932320

Abstract

Progress is being made in the development of an Ion Source Test Facility (ISTF) by D-Pace Inc. in collaboration with Buckley Systems Ltd. in Auckland, NZ. The first phase of the ISTF is to be commissioned in October 2015 with the second phase being commissioned in March 2016. The facility will primarily be used for the development and the commercialization of ion sources. It will also be used to characterize and further develop various D-Pace Inc. beam diagnostic devices.