The self-referenced spectral interferometry (SRSI) technique, which is usually used for microjoule-level femtosecond pulse characterization, is improved to characterize weak femtosecond pulses with nanojoule based on the transient-grating effect. Both femtosecond pulses from an amplifier with 3 nJ per pulse at 1 kHz repetition rates and femtosecond pulses from an oscillator with less than 0.5 nJ per pulse at 84 MHz repetition rates are successfully characterized. Furthermore, through a special design, the optical setup of the device is even smaller than a palm, which will make it simple and convenient during the application. These improvements extend the application of the SRSI technique to the characterization of femtosecond pulses in a broad range. Not only pulses from an amplifier but also pulses from an oscillator or weak pulses used in ultrafast spectroscopy can be monitored with this SRSI method right now.