Using rapid-scan EPR to improve the detection limit of quantitative EPR by more than one order of magnitude

J Magn Reson. 2017 Aug:281:17-25. doi: 10.1016/j.jmr.2017.04.003. Epub 2017 Apr 17.

Abstract

X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for amorphous silicon powder samples. By comparing the resulting signal intensities the feasibility of performing quantitative rapid-scan EPR is demonstrated. For different hydrogenated amorphous silicon samples, rapid-scan EPR results in signal-to-noise improvements by factors between 10 and 50. Rapid-scan EPR is thus capable of improving the detection limit of quantitative EPR by at least one order of magnitude. In addition, we provide a recipe for setting up and calibrating a conventional pulsed and continuous-wave EPR spectrometer for rapid-scan EPR.

Keywords: Amorphous silicon; Quantitative EPR; Rapid-scan EPR; Sensitivity.

Publication types

  • Research Support, N.I.H., Extramural
  • Research Support, Non-U.S. Gov't

MeSH terms

  • Electron Spin Resonance Spectroscopy / methods*
  • Limit of Detection
  • Microwaves
  • Powders
  • Signal Processing, Computer-Assisted
  • Signal-To-Noise Ratio
  • Silicon / chemistry

Substances

  • Powders
  • Silicon