High-Throughput Structural and Functional Characterization of the Thin Film Materials System Ni-Co-Al

ACS Comb Sci. 2017 Oct 9;19(10):618-624. doi: 10.1021/acscombsci.6b00176. Epub 2017 Aug 11.


High-throughput methods were used to investigate a Ni-Co-Al thin film materials library, which is of interest for structural and functional applications (superalloys, shape memory alloys). X-ray diffraction (XRD) measurements were performed to identify the phase regions of the Ni-Co-Al system in its state after annealing at 600 °C. Optical, electrical, and magneto-optical measurements were performed to map functional properties and confirm XRD results. All results and literature data were used to propose a ternary thin film phase diagram of the Ni-Co-Al thin film system.

Keywords: X-ray diffraction; combinatorial materials science; magneto-optical Kerr effect; materials library; sputtering; transmission electron microscopy.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Alloys / chemistry*
  • Aluminum / chemistry*
  • Cobalt / chemistry*
  • Nanostructures / chemistry
  • Nickel / chemistry*
  • Small Molecule Libraries
  • Surface Properties
  • Temperature


  • Alloys
  • Small Molecule Libraries
  • Cobalt
  • Nickel
  • Aluminum