Characterization at the Level of Individual Crystals: Single-Crystal MFI Type Zeolite Grains

Tim Gruene; Teng Li; Eric van Genderen; Ana B Pinar; Jeroen A van Bokhoven

doi:10.1002/chem.201704213

Characterization at the Level of Individual Crystals: Single-Crystal MFI Type Zeolite Grains

Chemistry. 2018 Feb 16;24(10):2384-2388. doi: 10.1002/chem.201704213. Epub 2018 Jan 17.

Authors

Tim Gruene¹, Teng Li², Eric van Genderen¹, Ana B Pinar¹, Jeroen A van Bokhoven^{1

2}

Affiliations

¹ Paul Scherrer Institut, 5232, Villigen PSI, Switzerland.
² ETH Zurich, Inst. f. Chemie- u. Bioing.wiss., Vladimir-Prelog-Weg 1-5/10, 8093, Zurich, Switzerland.

PMID: 29193398
DOI: 10.1002/chem.201704213

Abstract

Electron-diffraction data on the zeolites Silicalite-1 and ZSM-5 (both MFI framework type) were collected from individual grains of about 150×100×50 nm³ . Crystals were synthesized with tetrapropylammonium as structure-directing agent. The resolution extended to about 0.8 Å for Silicalite-1 and about 0.9-1.0 Å for ZSM-5 crystals. Analysis of several data sets showed that at the nanometre-scale, these zeolite crystals are single crystals and not intergrown.

Keywords: X-ray diffraction; electron diffraction; structure-performance relationship; zeolites.