Resistive switching in nanostructured metal oxide semiconductors has been broadly understood to originate from the dynamics of its native point defects. Experimental results of switching observed in individual n-ZnO nanorods grown on a p-type polymer is presented along with an empirical model describing the underlying defect dynamics necessary to observe bi-polar switching. Selective photo excitation of electrons into the defect states delineates the incidence and role of an ionic current in the switching behavior. The understanding further extends to the observance of a negative differential resistance regime that is often coincident in such systems. The analysis not only unifies the underlying physics of the two phenomena but also offers further confidence in the proposed mechanism. We conclude by demonstrating that the effective memresistance of such devices is a strong function of the operating bias and identify parameters that optimize switching performance.