We develop a local birefringence determination method of measuring the distribution of external force-induced birefringence in spun high-birefringence (HiBi) fiber (spun HiBi fiber) using polarimetric optical frequency domain reflectometry (P-OFDR). By constructing the similarity between the measured Mueller matrices and fiber under test (FUT) matrices using two input states of polarization, the total phase retardance caused by the local birefringence of FUT can be determined from the trace of the measured matrices. We measure the local birefringence of spun HiBi fibers from two different manufacturers and telecom SMF (G652.D) caused by bending, twist, and transverse stress using our presented P-OFDR system. From the experimental results, we find that bending- and twist-induced birefringences of spun HiBi fiber are much lower than those of standard SMF. More remarkably, the coating package influences the transverse stress induced birefringence of spun HiBi fibers significantly. These experimental results verify that our presented method is beneficial to evaluating and improving spun HiBi fibers' quality.