Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline

Bi Hsuan Lin; Yu Hao Wu; Xiao Yun Li; Hsu Cheng Hsu; Yu Cheng Chiu; Chien Yu Lee; Bo Yi Chen; Gung Chian Yin; Shao Chin Tseng; Shih Hung Chang; Mau Tsu Tang; Wen Feng Hsieh

doi:10.1107/S1600577519013675

Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline

J Synchrotron Radiat. 2020 Jan 1;27(Pt 1):217-221. doi: 10.1107/S1600577519013675. Epub 2020 Jan 1.

Authors

Affiliations

¹ National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan.
² Department of Photonics, National Cheng Kung University, Tainan 70101, Taiwan.
³ Department of Chemical Engineering, National Taiwan University of Science and Technology, Taipei 10607, Taiwan.
⁴ Department of Photonics and Institute of Electro-Optical Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan.

PMID: 31868755
DOI: 10.1107/S1600577519013675

Abstract

Time-resolved X-ray excited optical luminescence (TR-XEOL) was developed successfully for the 23A X-ray nanoprobe beamline located at the Taiwan Photon Source (TPS). The advantages of the TR-XEOL facility include (i) a nano-focused X-ray beam (<60 nm) with excellent spatial resolution and (ii) a streak camera that can simultaneously record the XEOL spectrum and decay time. Three time spans, including normal (30 ps to 2 ns), hybrid (30 ps to 310 ns) and single (30 ps to 1.72 µs) bunch modes, are available at the TPS, which can fulfil different experimental conditions involving samples with various lifetimes. It is anticipated that TR-XEOL at the TPS X-ray nanoprobe could provide great characterization capabilities for investigating the dynamics of photonic materials.

Keywords: TR-XEOL; XEOL; XRF; streak camera.