Phosphor screens have attracted increasing global interest because they can aid the acquisition of high-quality images while simultaneously reducing exposure. However, although increasing the thickness of the phosphor screen increases exposure efficiency due to scattered light, it also leads to a broader light spread, which results in poorer resolution. Hence, in this study, we implemented a reflector using a mirror-coating technique on the surface of a phosphor screen and analyzed its characteristics in terms of luminescence intensity and resolution. We present the fabrication and measurement of the phosphor screen based on a reflector containing Gd₂O₂S:Tb. The phosphor screen containing the reflector can be fabricated via the screen-printing method and roll-to-roll sputtering method. In particular, when compared to the condition without a reflector, Al and Cu reflectors showed improvements in luminescence intensity of 15.7% and 12.2%, respectively, as well as lower full widths at half maximum of 11.45 and 9.08, respectively. This quantitatively demonstrates that Cu and Al are suitable reflector materials to improve exposure efficiency while maintaining resolution in radiography systems. Moreover, because we did not utilize an optical assembly, which improves the transmission efficiency by matching the different refractive indices of the phosphor screen and photo-detector, we believe that the quantity of photons could be further improved if the reflectors were applied to a commercial product. Thus, future studies using single-layer anti-reflector coating techniques with optical assemblies are warranted.