Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Nat Commun. 2020 Nov 10;11(1):5689. doi: 10.1038/s41467-020-19053-9.


The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.