The rice panicle seed setting rate is extremely important for calculating rice yield and performing genetic analysis. Unlike machine vision, X-ray computed tomography (CT) imaging is a nondestructive technique that provides direct information on the internal and external structure of rice panicles. However, occlusion and adhesion of panicles and grains in a CT image sequence make these objects difficult to identify, which in turn hinders accurate determination of the seed setting rate of rice panicles. Therefore, this paper proposes a method based on a mask region convolutional neural network (Mask R-CNN) for feature extraction and three-dimensional (3-D) recognition of CT images of rice panicles. X-ray CT feature characterization was combined with the Mask R-CNN algorithm to perform feature extraction and classification of a panicle and grains in each layer of the CT sequence. The Euclidean distance between adjacent layers was minimized to extract the features of a 3-D panicle and grains. The results were used to calculate the rice panicle seed setting rate. The proposed method was experimentally verified using eight sets of different rice panicles. The results showed that the proposed method can efficiently identify and count plump grains and blighted grains to achieve an accuracy above 99% for the seed setting rate.
Keywords: 3‐D recognition; X‐ray CT imaging; mask R‐CNN; rice phenotype; seed setting rate.
© 2021 North University of China. Plant Direct published by American Society of Plant Biologists and the Society for Experimental Biology and John Wiley & Sons Ltd.