Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band

Sci Rep. 2021 Oct 19;11(1):20679. doi: 10.1038/s41598-021-00187-9.


Mm-wave dielectric waveguides are a promising and low-cost technology for the transmission of ultra-high data rates. Besides the attenuation (losses) and group delay, the bending loss of the dielectric waveguides is also one of the key parameters to establish the capacity and energy efficiency of such wired links, when deployed in realistic scenarios. In this context, we report the experimental characterizations of bending effects for various solid and hollow commercially available dielectric waveguides at V-band (50-75 GHz). A wide-band transition has been designed to carry out the measurements using a Vector Network Analyzer (VNA) and extension modules. The measured results are in very good agreement with full-wave simulations. Our experimental results show an average bending loss of 1.46 dB over the entire V-band for the fundamental [Formula: see text] mode of a PTFE solid dielectric waveguide (core diameter of 3.06 mm) with a 90° bending angle and 25 mm radius of curvature. This value rises up to 2.88 dB (or 3.25 dB) when bending radius is changed to 15 mm (or bending angle grows up to 140°). The measurements also show that the measured bending losses increase significantly for hollow dielectric waveguides, in particular when the inner to outer diameter ratio gets larger.