A general and simple method for evaluating the electrical transport performance of graphene by the van der Pauw-Hall measurement

Fangzhu Qing; Yang Shu; Linsen Qing; Yuting Niu; He Guo; Shuyi Zhang; Chunlin Liu; Changqing Shen; Wanli Zhang; Samuel S Mao; Wenjuan Zhu; Xuesong Li

doi:10.1016/j.scib.2018.10.007

A general and simple method for evaluating the electrical transport performance of graphene by the van der Pauw-Hall measurement

Sci Bull (Beijing). 2018 Nov 30;63(22):1521-1526. doi: 10.1016/j.scib.2018.10.007. Epub 2018 Oct 18.

Authors

Fangzhu Qing¹, Yang Shu², Linsen Qing³, Yuting Niu², He Guo², Shuyi Zhang², Chunlin Liu², Changqing Shen², Wanli Zhang², Samuel S Mao⁴, Wenjuan Zhu⁵, Xuesong Li⁶

Affiliations

¹ State Key Laboratory of Electronic Thin Films and Integrated Devices & School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China; National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu 610054, China.
² State Key Laboratory of Electronic Thin Films and Integrated Devices & School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China.
³ Chengdu Institute of Biology, Chinese Academy of Sciences, Chengdu 610041, China.
⁴ Institute of New Energy, Shenzhen 518031, China; Department of Mechanical Engineering, University of California at Berkeley, Berkeley, CA 94720, USA.
⁵ Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA.
⁶ State Key Laboratory of Electronic Thin Films and Integrated Devices & School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China. Electronic address: lxs@uestc.edu.cn.

PMID: 36658834
DOI: 10.1016/j.scib.2018.10.007

Abstract

Expected for many promising applications in the field of electronics and optoelectronics, a reliable method for the characterization of graphene electrical transport properties is desired to predict its device performance or provide feedback for its synthesis. However, the commonly used methods of extracting carrier mobility from graphene field effect transistor or Hall-bar is time consuming, expensive, and significantly affected by the device fabrication process other than graphene itself. Here we reported a general and simple method to evaluate the electrical transport performance of graphene by the van der Pauw-Hall measurement. By annealing graphene in vacuum to remove the adsorbed dopants and then exposing it in ambient surroundings, carrier mobility as a function of density can be measured with the increase of carrier density due to the dopant re-adsorption from the surroundings. Further, the relationship between the carrier mobility and density can be simply fitted with a power equation to the first level approximation, with which any pair of measured carrier mobility and density can be normalized to an arbitrary carrier density for comparison. We experimentally demonstrated the reliability of the method, which is much simpler than making devices and may promote the standard making for graphene characterization.

Keywords: Chemical vapor deposition (CVD); Graphene; Hall; Van der Pauw.