Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):2064-2065.
doi: 10.1093/micmic/ozad067.1068.
Authors
M T Hotz
1
,
J Martis
1
2
,
T Radlicka
3
,
N J Bacon
1
,
N Dellby
1
,
T C Lovejoy
1
,
S C Quillin
1
,
H Y Hwang
4
,
P Singh
4
,
O L Krivanek
1
5
Affiliations
1
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA.
2
Department of Mechanical Engineering, Stanford University, Stanford, CA, USA.
3
Institute of Scientific Instruments of CAS, Královopolská 147, Brno, Czech Republic.
4
Department of Applied Physics, Stanford University, Stanford, CA, USA.
5
Department of Physics, Arizona State University, Tempe, AZ, USA.
PMID:
37612905
DOI:
10.1093/micmic/ozad067.1068
No abstract available