Deep Learning for Automated Quantification of Irradiation Defects in TEM Data: Relating Pixel-level Errors to Defect Properties
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1559-1560.
doi: 10.1093/micmic/ozad067.802.
Authors
Rajat Sainju
1
,
Graham Roberts
2
,
Wei-Ying Chen
3
,
Brian Hutchinson
4
5
,
Qian Yang
2
,
Caiwen Ding
2
,
Danny J Edwards
6
,
Meimei Li
3
,
Yuanyuan Zhu
1
6
Affiliations
1
Department of Materials Science and Engineering, University of Connecticut, Storrs, CT, USA.
2
Department of Computer Science and Engineering, University of Connecticut, Storrs, CT, USA.
3
Nuclear Science and Engineering Division, Argonne National Laboratory, Lemont, IL, USA.
4
Computer Science Department, Western Washington University, Bellingham, WA, USA.
5
National Security Directorate, AI and Data Analytics Division, Pacific Northwest National Laboratory, Richland, WA, USA.
6
Energy and Environment Directorate, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA, USA.
PMID:
37613789
DOI:
10.1093/micmic/ozad067.802
No abstract available