We aimed to determine if audible sounds could change the forces acting between charged surfaces in water and their electric double layers (EDLs). This was achieved by using an atomic force microscope to measure force-distance curves between a microsized silica particle attached to a cantilever (probe) and a silicon wafer in water in the absence and presence of sound. Sound decreased the repulsive forces acting between the probe and silicon wafer, where the range and magnitude of the forces decreased with an increase in the sound frequency from 300 to 15000 Hz. The decrease in the force range was explained by a decrease in the EDL thickness. This result was explained by (1) the shrinkage of the EDL by a high-pressure region of the sound wave, where an increased sound frequency caused the number of high-pressure regions that passed between the probe and the substrate to increase and (2) the inability of the EDL to fully re-expand to its original thickness during the time that a low-pressure region of the sound wave was applied. The decrease in the force magnitude with a sound frequency increase was explained by the increased screening of charged surfaces that accompanies a decrease in the EDL thickness. An increase in the force measurement speed caused the sound waves to reduce the repulsive forces less. A faster speed decreased the time to measure a force curve, which reduced the number of high-pressure regions of the sound wave to pass through the water between the probe and the substrate. This reduced the number of times that the EDL was compressed by the sound wave.