EDIC intensity correction of electron diffraction

Erzsébet Dodony; István Dódony; György Sáfrán

doi:10.1016/j.micron.2024.103649

EDIC intensity correction of electron diffraction

Micron. 2024 Aug:183:103649. doi: 10.1016/j.micron.2024.103649. Epub 2024 May 8.

Authors

Erzsébet Dodony¹, István Dódony², György Sáfrán³

Affiliations

¹ Hungarian Research Network, Center for Energy Research, Institute of Technical Physics and Materials Science, Thin Film Physics Laboratory, Konkoly-Thege M. St. 29-33, Budapest H-1121, Hungary; Department of Material Physics, Eötvös Loránd University, Pázmány Péter Sétány 1/A, Budapest H-1117, Hungary. Electronic address: erzsebet.dodony@ek.hun-ren.hu.
² Department of Mineralogy, Eötvös Loránd University, Pázmány Péter Sétány 1/C, Budapest H-1117, Hungary.
³ Department of Material Physics, Eötvös Loránd University, Pázmány Péter Sétány 1/A, Budapest H-1117, Hungary.

PMID: 38729043
DOI: 10.1016/j.micron.2024.103649

Abstract

Transmission electron microscopy (TEM) has recently become indispensable in determining crystal structures. The location of atoms in crystals can be determined using electron diffraction (ED) intensity data series if the diffracted intensities are directly proportional to the square of the structure factor (|F_hkl|²). However, due to the crystal thickness, the used electron wavelength and the potential misalignment of the measured crystal the detected intensities differ from the ideal values. A method, Electron Diffraction Intensity Correction (EDIC), and a computer program have been developed to recover the ideal |F_hkl|² proportional intensities from experimental data for kinematic scattering, for further structure studies.

Keywords: Crystal structure; Crystallographic misorientation; Electron diffraction intensity correction; Electron diffraction pattern; Transmission electron microscopy.