State-of-the-art electron beams for compact tools of ultrafast science

Peter Salén; Anatoliy Opanasenko; Giovanni Perosa; Vitaliy Goryashko

doi:10.1016/j.ultramic.2024.114080

State-of-the-art electron beams for compact tools of ultrafast science

Ultramicroscopy. 2025 Jan:268:114080. doi: 10.1016/j.ultramic.2024.114080. Epub 2024 Nov 26.

Authors

Peter Salén¹, Anatoliy Opanasenko², Giovanni Perosa³, Vitaliy Goryashko⁴

Affiliations

¹ FREIA Laboratory, Department of Physics and Astronomy, Uppsala University, Å ngströmlaboratoriet, 75120 Uppsala, Sweden. Electronic address: peter.salen@physics.uu.se.
² FREIA Laboratory, Department of Physics and Astronomy, Uppsala University, Å ngströmlaboratoriet, 75120 Uppsala, Sweden; National Science Center 'Kharkiv Institute of Physics and Technology', Akademichna Str. 1, 61108 Kharkiv, Ukraine.
³ FREIA Laboratory, Department of Physics and Astronomy, Uppsala University, Å ngströmlaboratoriet, 75120 Uppsala, Sweden.
⁴ FREIA Laboratory, Department of Physics and Astronomy, Uppsala University, Å ngströmlaboratoriet, 75120 Uppsala, Sweden; RIKEN, SPring-8, 679-5148 Hyogo, Japan.

PMID: 39622107
DOI: 10.1016/j.ultramic.2024.114080

Abstract

We review state-of-the-art electron beams for single-shot megaelectronvolt ultrafast electron diffraction (MeV-UED) and compact light sources. Our primary focus is on sub-100 femtosecond electron bunches in the 2-30 MeV energy range. We demonstrate that our new and recent simulation results permit significantly improved bunch parameters for these applications.

Keywords: Inverse compton scattering; Ultrafast electron diffraction; Velocity bunching.