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High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices.
Peverini F, Bizzarri M, Boscardin M, Calcagnile L, Caprai M, Caricato AP, Cirrone GAP, Crivellari M, Cuttone G, Dunand S, Fanò L, Gianfelici B, Hammad O, Ionica M, Kanxheri K, Large M, Maruccio G, Menichelli M, Monteduro AG, Moscatelli F, Morozzi A, Pallotta S, Papi A, Passeri D, Petasecca M, Petringa G, Pis I, Quarta G, Rizzato S, Rossi A, Rossi G, Scorzoni A, Soncini C, Servoli L, Tacchi S, Talamonti C, Verzellesi G, Wyrsch N, Zema N, Pedio M. Peverini F, et al. Among authors: scorzoni a. Nanomaterials (Basel). 2022 Oct 4;12(19):3466. doi: 10.3390/nano12193466. Nanomaterials (Basel). 2022. PMID: 36234601 Free PMC article.
A Study of the Radiation Tolerance of CVD Diamond to 70 MeV Protons, Fast Neutrons and 200 MeV Pions.
Bäni L, Alexopoulos A, Artuso M, Bachmair F, Bartosik MR, Beck HC, Bellini V, Belyaev V, Bentele B, Bes A, Brom JM, Chiodini G, Chren D, Cindro V, Claus G, Collot J, Cumalat J, Curtoni S, Dabrowski AE, D'Alessandro R, Dauvergne D, De Boer W, Dorfer C, Dünser M, Eigen G, Eremin V, Forneris J, Gallin-Martel L, Gallin-Martel ML, Gan KK, Gastal M, Ghimouz A, Goffe M, Goldstein J, Golubev A, Gorišek A, Grigoriev E, Grosse-Knetter J, Grummer A, Hiti B, Hits D, Hoeferkamp M, Hosselet J, Hügging F, Hutson C, Janssen J, Kagan H, Kanxheri K, Kass R, Kis M, Kramberger G, Kuleshov S, Lacoste A, Lagomarsino S, Giudice AL, Paz IL, Lukosi E, Maazouzi C, Mandić I, Marcatili S, Marino A, Mathieu C, Menichelli M, Mikuž M, Morozzi A, Moscatelli F, Moss J, Mountain R, Oh A, Olivero P, Passeri D, Pernegger H, Perrino R, Picollo F, Pomorski M, Potenza R, Quadt A, Rarbi F, Re A, Reichmann M, Roe S, Rossetto O, Becerra DAS, Schmidt CJ, Schnetzer S, Sciortino S, Scorzoni A, Seidel S, Servoli L, Smith DS, Sopko B, Sopko V, Spagnolo S, Spanier S, Stenson K, Stone R, Stugu B, Sutera C, Traeger M, Trischuk W, Truccato M, Tuvè C, Velthuis J, Wagner S, Wallny R, Wang J, Wermes N, Wickramasinghe J, Yamoun… See abstract for full author list ➔ Bäni L, et al. Among authors: scorzoni a. Sensors (Basel). 2020 Nov 20;20(22):6648. doi: 10.3390/s20226648. Sensors (Basel). 2020. PMID: 33233598 Free PMC article.
Layered distribution of charge carriers in organic thin film transistors.
Shehu A, Quiroga SD, D'Angelo P, Albonetti C, Borgatti F, Murgia M, Scorzoni A, Stoliar P, Biscarini F. Shehu A, et al. Among authors: scorzoni a. Phys Rev Lett. 2010 Jun 18;104(24):246602. doi: 10.1103/PhysRevLett.104.246602. Epub 2010 Jun 16. Phys Rev Lett. 2010. PMID: 20867320