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2018 4
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2021 0
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Page 1
Bias-stress-stable solution-processed oxide thin film transistors.
Jeong Y, Bae C, Kim D, Song K, Woo K, Shin H, Cao G, Moon J. Jeong Y, et al. Among authors: bae c. ACS Appl Mater Interfaces. 2010 Mar;2(3):611-5. doi: 10.1021/am900787k. ACS Appl Mater Interfaces. 2010. PMID: 20356256 No abstract available.
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