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A dual-spectrometer approach to reflectance measurements under sub-optimal sky conditions.
Bachmann CM, Montes MJ, Parrish CE, Fusina RA, Nichols CR, Li RR, Hallenborg E, Jones CA, Lee K, Sellars J, White SA, Fry JC. Bachmann CM, et al. Opt Express. 2012 Apr 9;20(8):8959-73. doi: 10.1364/OE.20.008959. Opt Express. 2012. PMID: 22513607