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Inert ambient annealing effect on MANOS capacitor memory characteristics.
Nikolaou N, Dimitrakis P, Normand P, Skarlatos D, Giannakopoulos K, Mergia K, Ioannou-Sougleridis V, Kukli K, Niinistö J, Mizohata K, Ritala M, Leskelä M. Nikolaou N, et al. Among authors: skarlatos d. Nanotechnology. 2015 Mar 27;26(13):134004. doi: 10.1088/0957-4484/26/13/134004. Epub 2015 Mar 12. Nanotechnology. 2015. PMID: 25764569