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Page 1
X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals.
Wicht T, Müller S, Weingärtner R, Epelbaum B, Besendörfer S, Bläß U, Weisser M, Unruh T, Meissner E. Wicht T, et al. Among authors: meissner e. J Appl Crystallogr. 2020 Jul 30;53(Pt 4):1080-1086. doi: 10.1107/S1600576720008961. eCollection 2020 Aug 1. J Appl Crystallogr. 2020. PMID: 32788905 Free PMC article.
Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment.
Tajalli A, Borga M, Meneghini M, De Santi C, Benazzi D, Besendörfer S, Püsche R, Derluyn J, Degroote S, Germain M, Kabouche R, Abid I, Meissner E, Zanoni E, Medjdoub F, Meneghesso G. Tajalli A, et al. Among authors: meissner e. Micromachines (Basel). 2020 Jan 17;11(1):101. doi: 10.3390/mi11010101. Micromachines (Basel). 2020. PMID: 31963553 Free PMC article.